Product Description
Combined multifunctional X-ray diffractometer and high resolution X-ray diffractometer are widely used in various fields of material structure analysis. The materials for analysis include metal materials, inorganic materials, composite materials, organic materials, nanomaterials and superconducting materials. The material states that can be analyzed include powder samples, bulk samples, thin film samples and micro-area samples. It is widely used in clay minerals, cement building materials, environmental dust, chemical products, pharmaceuticals, asbestos, rock minerals, polymers and other research fields.
DX series diffractometer is designed for material research and industrial product analysis. It is a perfect product combining conventional analysis with special purpose measurement.
-The perfect combination of hardware system and software system meets the needs of scholars and researchers in different application fields.
-High-precision diffraction angle measurement system can obtain more accurate measurement results.
-The X-ray generator control system with high stability can obtain more stable repetitive measurement accuracy.
-Various functional accessories meet the needs of different testing purposes.
-Programmed operation, integrated structure design, easy to operate, the appearance of the instrument is more beautiful.
X-ray diffractometer (XRD) is a universal testing instrument for revealing the crystal structure and chemical information of materials.
-Identification of one and many phases in unknown samples
-Quantitative analysis of known phases in mixed samples
-Crystal Structure Analysis (Rietveld Structure Analysis)
-Crystal Structure Change under Unconventional Conditions (High Temperature and Low Temperature)
-Thin film sample analysis, including film phase, multilayer thickness, surface roughness, charge density
-Analysis of Microarea Samples
-Texture and Stress Analysis of Metal Materials
Combination of Perfect Quality and Excellent Performance
-In addition to basic functions, DX series diffractometer can quickly configure various accessories and has super analytical ability.
-High-precision machining greatly improves the reproducibility of attachment installation position. Software automatically identifies the corresponding attachment, does not need to calibrate the light path, attachment installation implements Plug and Play, and the simplest operation can meet the needs of special purpose measurement.
Perfect Combination of High Performance and Practice
-Geometric optical design based on theta-theta facilitates sample preparation and installation of various accessories -The application of cermet X-ray tube greatly improves the operating power of diffractometer -Closed proportional counter, durable and maintenance-free -Silicon drift detector has superior angular resolution and energy resolution, and the measurement speed is increased by more than three times. -Rich diffractometer accessories to meet the needs of different analytical purposes -Automatic Recognition of Various Functional Accessories of Diffractometer -Modular design, or Plug and Play components, allows operators to correctly use the corresponding accessories of the diffractometer without correcting the optical system.
Data processing software includes the following functions.
-Basic data processing functions (peak searching, smoothing, background subtraction, peak fitting, peak magnification, spectral contrast, K alpha 1, alpha 2 stripping, index of diffraction lines, etc.)
-Quick Quantitative Analysis without Standard Samples
-Grain size measurement
-Crystal Structure Analysis (Measurement and Refinement of Cell Parameters)
-Macro stress measurement and micro stress calculation;
-Two-dimensional and three-dimensional display of multi-drawing;
-Diffraction peak pattern clustering analysis;
-The half peak width correction curve of diffraction data;
-Angular deviation correction curve of diffraction data;
-Routine quantitative analysis based on Rietveld;
-Using ICDD database or user database for phase qualitative analysis;
-Quantitative analysis using ICDD database or ICSD database;
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